满足TMR间距约束的高压水堆辐射硬化合法化

C. Georgakidis, C. Sotiriou
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引用次数: 2

摘要

器件特征尺寸和电源电压的减小使现代集成电路(ic)更容易受到软错误(SEs)的影响,即电离辐射引起的瞬态故障。此外,辐射硬化设计流程不同于标准设计流程,目前缺乏工业EDA工具支持。R-Abax是一种基于三模冗余(TMR)技术的学术,位移驱动的RADHARD合法化算法,仅适用于flip - flop (FF)。R-Abax确保粒子撞击只会影响TMR三重态中的一个FF,通过强制FF三重态之间的最小间距约束。虽然位移驱动的R-Abax算法很容易满足间距约束,但其结果质量(QoR)很大程度上取决于原始位置的QoR。在这项工作中,我们提出了一个改进版本的R-Abax,它在评估细胞移动时考虑电路的总半周长(HPWL)。实验结果表明,与驱位驱动的R-Abax相比,hpwl驱动的R-Abax在功率、性能和面积(PPA)方面都有所提高。对于hpwl驱动的R-Abax,与原始版本一样,三组ff之间较大的最小间距约束不会显著影响QoR,因此提出的RADHARD流对于实现瞬态故障缓解具有吸引力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Radiation Hardening Legalisation Satisfying TMR Spacing Constraints with Respect to HPWL
Reduction in device feature sizes and supply voltage renders modern Integrated Circuits (ICs) more susceptible to Soft Errors (SEs), i.e. Transient Faults caused by ionising radiation. Moreover, the RADiation HARDening design flow differs from the standard design flow and currently suffers from insufficient industrial EDA tool support. R-Abax is an academic, Displacement-driven RADHARD legalisation algorithm, based on the Triple Modular Redundancy (TMR) technique, solely for Flip-Flops (FF). R-Abax ensures that a particle strike will only affect one FF of the TMR triplet, by enforcing minimum spacing constraints among FF triplets. Although the Displacement-driven R-Abax algorithm easily satisfies the spacing constraints, its Quality of Results (QoR) depends strongly on the QoR of the original placement. In this work, we propose an improved version of R-Abax, which considers the circuit Total Half-Perimeter Wire Length (HPWL) when evaluating cell moves. Experimental results indicate that the HPWL-driven R-Abax can achieve an improvement in Power, Performance and Area (PPA), compared to the Displacement-driven version. For the HPWL-driven R-Abax, as with the original version, larger minimum spacing constraints between triplet FFs does not significantly affect the QoR, rendering the proposed RADHARD flow attractive for achieving Transient Faults mitigation.
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