集成电路与封装协同设计:挑战还是梦想?

R. Goering, M. Casale-Rossi
{"title":"集成电路与封装协同设计:挑战还是梦想?","authors":"R. Goering, M. Casale-Rossi","doi":"10.1109/ISQED.2003.1194739","DOIUrl":null,"url":null,"abstract":"In recent years, major breakthroughs have occurred in packaging technology, which have led to the industrialization of several kinds of new packages, more powerful, and yet more flexible, in the attempt to cope with the challenges posed by multi-million gates and multi-GHz systems-on-a-chip (SOC). While offering a great deal of opportunities, ball-grid array (BGA) substrates, flip-chip and multi-stacked dies require an unprecedented level of integration between IC and package design and verification.","PeriodicalId":448890,"journal":{"name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","volume":"23 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"IC & package co-design: challenge or dream?\",\"authors\":\"R. Goering, M. Casale-Rossi\",\"doi\":\"10.1109/ISQED.2003.1194739\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In recent years, major breakthroughs have occurred in packaging technology, which have led to the industrialization of several kinds of new packages, more powerful, and yet more flexible, in the attempt to cope with the challenges posed by multi-million gates and multi-GHz systems-on-a-chip (SOC). While offering a great deal of opportunities, ball-grid array (BGA) substrates, flip-chip and multi-stacked dies require an unprecedented level of integration between IC and package design and verification.\",\"PeriodicalId\":448890,\"journal\":{\"name\":\"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.\",\"volume\":\"23 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-03-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2003.1194739\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2003.1194739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

近年来,封装技术取得了重大突破,导致了几种更强大、更灵活的新型封装的产业化,以应对数百万门和多ghz系统单片(SOC)带来的挑战。在提供大量机会的同时,球栅阵列(BGA)基板、倒装芯片和多堆叠芯片要求IC与封装设计和验证之间的集成达到前所未有的水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
IC & package co-design: challenge or dream?
In recent years, major breakthroughs have occurred in packaging technology, which have led to the industrialization of several kinds of new packages, more powerful, and yet more flexible, in the attempt to cope with the challenges posed by multi-million gates and multi-GHz systems-on-a-chip (SOC). While offering a great deal of opportunities, ball-grid array (BGA) substrates, flip-chip and multi-stacked dies require an unprecedented level of integration between IC and package design and verification.
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