塑料封装器件因成型工艺缺陷导致的无法识别缺陷的失效调查

Jinbao Cai, Wei Li, Xuanlong Chen, Hongqin Wang, Sheng-zong He
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引用次数: 0

摘要

芯片与粘接线和引线框架的塑料封装装置,密封与成型化合物,以防止任何异物进入。这项工作是在成型过程中完成的,成型过程是器件封装中非常重要的一个环节。但在设备、环境因素或原材料的影响下,由于成型工艺的缺陷,可能会产生一些封装缺陷。其中一些缺陷在器件出厂时通过外观检查和电气参数测试是无法发现的。具有这些无法识别的包装缺陷的设备将流入市场,并且通常在消费者使用这些设备时导致产品故障。本文将对其中的一些失效案例进行分析,以说明这些缺陷是什么,并研究失效是如何发生的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation on failures of plastic package devices with unidentifiable defects related to deficient molding process
Chip with bonding wires and lead frame of a plastic encapsulated device is sealed with molding compound to prevent any foreign matters from getting inside. This work is completed during the process called as molding process, which is a very important link in device encapsulating. However, under the influence of equipment, environmental factors or raw material, some encapsulation defects might arise due to deficient molding process. Some of these defects could not be identified by appearance inspection and electrical parameter test in the device factory. The devices with these unidentifiable package defects would flow into the market and usually lead to product failures when the devices are used by consumers. This paper will analyze some failure cases of those to show what these defects are and study how the failure happen.
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