{"title":"Intersil ISL73141SEH精密SAR ADC单事件效应测试结果","authors":"J. Harris, L. Pearce, N. V. van Vonno, E. Thomson","doi":"10.1109/REDW51883.2020.9325849","DOIUrl":null,"url":null,"abstract":"We report the results of destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL73141SEH 14-bit 750/1000ksps precision SAR ADC.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Single-Event Effects Test Results of the Intersil ISL73141SEH Precision SAR ADC\",\"authors\":\"J. Harris, L. Pearce, N. V. van Vonno, E. Thomson\",\"doi\":\"10.1109/REDW51883.2020.9325849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the results of destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL73141SEH 14-bit 750/1000ksps precision SAR ADC.\",\"PeriodicalId\":127384,\"journal\":{\"name\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW51883.2020.9325849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single-Event Effects Test Results of the Intersil ISL73141SEH Precision SAR ADC
We report the results of destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL73141SEH 14-bit 750/1000ksps precision SAR ADC.
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