硅太阳能电池用KOH表面织构硅{100}的简便方法

A. Gupta, P. Pal, C. Sharma
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引用次数: 1

摘要

在碱性溶液中湿法蚀刻Si{100}会产生锥体结构,大部分由四个{111}面包围。这种几何结构作为优良的光捕获结构,有可能有助于提高太阳能电池的效率。本文系统地研究了极低浓度氢氧化钾(KOH)对Si{100}蚀刻表面形貌的影响。在0.5 wt%的步骤中,KOH浓度从1.0 wt%变化到0.1 wt%,以研究蚀刻浓度的影响。湿法蚀刻在70℃的固定温度下进行,蚀刻时间为5 ~ 40分钟。每隔5分钟采样进行调查。在0.5 wt% KOH中织构10分钟的样品上测量的最低反射率约为12%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Facile Way of Surface Texturing of Si{100} using KOH for Silicon Solar Cells
Wet etching of Si{100} in an alkaline solution result in pyramidal structures, mostly bounded by four {111} planes. Such geometrical structures work as excellent light trapping structures and potentially help in the efficiency increment of solar cells. In this work, the effect of very low concentration potassium hydroxide (KOH) on the etched surface morphology of Si{100} is systematically studied. KOH concentration is varied from 1.0 to 0.1 wt% KOH in a step of 0.5 wt% to investigate the effect of etching concentration. Wet etching is carried at a fixed temperature of 70°C for 5 to 40 min of etching time. Samples are taken for investigation after every 5 minutes of interval. The lowest reflectance of around 12 % is measured on the samples textured in 0.5 wt% KOH for 10 min.
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