(若干)在复杂异构集成系统中纳入BIST的开放问题

2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications Pub Date : 2010-01-13 DOI:10.1109/DELTA.2010.67

Manuel J. Barragan Asian, G. Huertas, A. Rueda, J. Huertas

{"title":"(若干)在复杂异构集成系统中纳入BIST的开放问题","authors":"Manuel J. Barragan Asian, G. Huertas, A. Rueda, J. Huertas","doi":"10.1109/DELTA.2010.67","DOIUrl":null,"url":null,"abstract":"This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.","PeriodicalId":421336,"journal":{"name":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems\",\"authors\":\"Manuel J. Barragan Asian, G. Huertas, A. Rueda, J. Huertas\",\"doi\":\"10.1109/DELTA.2010.67\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.\",\"PeriodicalId\":421336,\"journal\":{\"name\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-01-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2010.67\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2010.67","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

本文概述了当必须将内置自检(BIST)应用于复杂的集成系统(包括模拟，混合信号和射频部件)时，测试技术提供了有前途的功能。重点是展示测试需求(基本上是在信号精度和频率方面)和测试质量之间良好权衡的技术。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.

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2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications

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