用于细间距键合的低温无焊剂倒装芯片技术

C. Davoine, M. Fendler, F. Marion, C. Louis, R. Fortunier
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引用次数: 9

摘要

本文介绍了一种倒装芯片技术,与传统的焊接或通过导电粘合剂粘合的方法相比,这是一种技术突破。电气连接是通过在延展性焊料中插入金属微尖来实现的。该工艺温度低,无助熔剂,适用于小间距、大型器件。在这里,我们介绍了我们的技术研究,以执行导电微针尖,如等离子体蚀刻,化学蚀刻,升空,以及金属材料的纳米压印技术的创新使用。金似乎是微针尖材料的一个很好的选择,因为金属间相与锡、铅或铟基焊料等焊料形成,并确保机械和电气接触。最后,我们给出了我们的测试车的连接结果,验证了通过插入15mum间距进行电气连接的原理。这种连接的电阻值也测量了30ma间距
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low temperature fluxless flip chip technology for fine pitch bonding
This paper describes a flip chip technology representing a technological breakthrough compared with conventional method such as soldering or the bonding through conductive adhesives. Electrical connections are performed by the insertion of metallic micro-tips in ductile solder material. As low temperature and fluxless technology, this method is adapted to fine pitch and large devices. Here we present our technological investigations to perform electrical conductive micro-tips such as plasma etching, chemical etching, lift-off, and an innovated use of nanoimprint technology of metallic materials. Gold appears as a good choice of material for micro-tips performing, because an intermetallic phase is formed with solder materials such as tin, lead, or indium based solder and ensures the mechanical and electrical contact. Finally we present the bonding results of our test vehicle which validate the principle of the electrical connection through insertion for a 15mum pitch. The resistance value of such a connection has also been measured for a 30mum pitch
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