{"title":"一种改进的SIMD网格处理器容错秩序滤波方法","authors":"Jai-hoon Kim, F. Lombardi, N. Vaidya","doi":"10.1109/DFTVS.1995.476946","DOIUrl":null,"url":null,"abstract":"This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processes such as the MasPar. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.","PeriodicalId":362167,"journal":{"name":"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An improved approach to fault tolerant rank order filtering on a SIMD mesh processor\",\"authors\":\"Jai-hoon Kim, F. Lombardi, N. Vaidya\",\"doi\":\"10.1109/DFTVS.1995.476946\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processes such as the MasPar. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.\",\"PeriodicalId\":362167,\"journal\":{\"name\":\"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1995.476946\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Workshop on Defect and Fault Tolerance in VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1995.476946","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An improved approach to fault tolerant rank order filtering on a SIMD mesh processor
This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processes such as the MasPar. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.