MgO基磁隧道结势垒击穿的电压加速和脉冲依赖

2016 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2016-09-26 DOI:10.1109/IRPS.2016.7574620

S. Van Beek, K. Martens, P. Roussel, G. Donadio, J. Swerts, S. Mertens, A. Thean, G. Kar, A. Furnémont, G. Groeseneken

{"title":"MgO基磁隧道结势垒击穿的电压加速和脉冲依赖","authors":"S. Van Beek, K. Martens, P. Roussel, G. Donadio, J. Swerts, S. Mertens, A. Thean, G. Kar, A. Furnémont, G. Groeseneken","doi":"10.1109/IRPS.2016.7574620","DOIUrl":null,"url":null,"abstract":"STT-MRAM is a promising non-volatile memory. For reliable lifetime predictions, a correct voltage acceleration model is essential. However, there is no consensus over what acceleration model to use. In this paper we study barrier breakdown time over an extended time range. With a maximum likelihood ratio method, we test the statistical significance of fits for different voltage acceleration models. We find that the power law best describes voltage acceleration. In addition we observe that the breakdown time is independent of duty cycle or pulse width.","PeriodicalId":172129,"journal":{"name":"2016 IEEE International Reliability Physics Symposium (IRPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Voltage acceleration and pulse dependence of barrier breakdown in MgO based magnetic tunnel junctions\",\"authors\":\"S. Van Beek, K. Martens, P. Roussel, G. Donadio, J. Swerts, S. Mertens, A. Thean, G. Kar, A. Furnémont, G. Groeseneken\",\"doi\":\"10.1109/IRPS.2016.7574620\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"STT-MRAM is a promising non-volatile memory. For reliable lifetime predictions, a correct voltage acceleration model is essential. However, there is no consensus over what acceleration model to use. In this paper we study barrier breakdown time over an extended time range. With a maximum likelihood ratio method, we test the statistical significance of fits for different voltage acceleration models. We find that the power law best describes voltage acceleration. In addition we observe that the breakdown time is independent of duty cycle or pulse width.\",\"PeriodicalId\":172129,\"journal\":{\"name\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2016.7574620\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2016.7574620","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

STT-MRAM是一种很有前途的非易失性存储器。对于可靠的寿命预测，正确的电压加速模型是必不可少的。然而，对于使用哪种加速模型没有达成共识。在本文中，我们研究了一个扩展时间范围内的势垒击穿时间。采用极大似然比方法，检验了不同电压加速模型拟合的统计显著性。我们发现幂律最能描述电压加速度。此外，我们观察到击穿时间与占空比或脉冲宽度无关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Voltage acceleration and pulse dependence of barrier breakdown in MgO based magnetic tunnel junctions

STT-MRAM is a promising non-volatile memory. For reliable lifetime predictions, a correct voltage acceleration model is essential. However, there is no consensus over what acceleration model to use. In this paper we study barrier breakdown time over an extended time range. With a maximum likelihood ratio method, we test the statistical significance of fits for different voltage acceleration models. We find that the power law best describes voltage acceleration. In addition we observe that the breakdown time is independent of duty cycle or pulse width.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE International Reliability Physics Symposium (IRPS)

自引率

0.00%

发文量