基于布局相关故障模型的模拟故障仿真

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.528009

R. Harvey, A. Richardson, E. Bruls, K. Baker

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引用次数: 59

摘要

提出了一种基于工艺缺陷统计提取的布局相关故障模型的复杂模拟电路可测试性分析方法。该技术已应用于混合信号锁相环路，并对包括现有生产测试在内的许多测试方法进行了评估。结论是，通过使用基于电源变化的补充测试，可以提高该测试获得的故障覆盖率。

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Analogue fault simulation based on layout dependent fault models

A testability analysis procedure for complex analogue circuits is presented based on layout dependent fault models extracted from process defect statistics. The technique has been applied to a mixed-signal phase locked loop circuit and a number of test methodologies have been evaluated including the existing production test. It is concluded that the fault coverage achieved by this test can be improved by the use of a supplementary test based on power supply variations.

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Proceedings., International Test Conference

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