通过区域阵列封装的膏体回流来碰撞焊料

Benlib Huang, N. Lee
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引用次数: 15

摘要

随着电子工业向更小、更轻、更快和更便宜的产品快速发展,包括bga、csp和倒装芯片在内的区域阵列封装迅速成为IC封装技术的焦点,主要原因是其处理坚固性和尺寸的大幅缩小。焊膏印刷和回流工艺是一种成熟、稳定、廉价的工艺。显然,如果采用传统的表面贴装焊膏印刷和回流工艺,焊料碰撞的吞吐量和成本至少可以提高一个数量级。在这个膏体碰撞过程中的工作很少,而且焦点只在晶圆碰撞上。在本研究中,膏体碰撞工艺的成本与其他工艺进行了比较。此外,还演示了采用高质量、高成品率的焊膏印刷/回流工艺对BGA、CSP和晶圆的焊料碰撞,并讨论了对焊膏材料和印刷参数的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Solder bumping via paste reflow for area array packages
With the electronic industry advancing rapidly toward smaller, lighter, faster, and cheaper products, area array packages including BGAs, CSPs, and flip chips quickly becomes the focus of IC packaging technology, mainly due to the robustness in handling and considerable reduction in size. The solder paste printing and reflow process is a well established robust and cheap process. Obviously, the throughput and the cost of solder bumping could be at least order of magnitude more favorable if a conventional surface mount solder paste printing and reflow process can be employed. Works in this paste bumping process has been rare, and the focus has been on wafer bumping only. In this study, the cost of the paste bumping process is compared with other processes. In addition, solder bumping for BGA, CSP, and wafer via a solder paste print/reflow process with high quality and high yield is demonstrated, and the requirements on solder paste materials and printing parameters are discussed.
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