创新的包装测试解决方案

Chin Chien Tee, Siang Soh
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引用次数: 0

摘要

包对包(PoP)结构是移动设备的一种使能技术,但在最终测试中却面临着不同寻常的挑战。由于封装技术是3D的,测试接触器也必须采取多维方法来封装。在最后的测试应用中,已经开发了一种相当标准化的方法来处理这种情况;虽然存在重大的工程挑战,但解决这些挑战的方法对于顶级插座制造商来说是众所周知的。系统级和工程表征应用提出了更加多样化的要求,并且需要在插座方面进行动态创新。本文详细描述了接触器在终级、系统级和工程特性测试中的异常要求,并提出了解决这些问题的创新解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Innovative solutions for Package on Package test
Package on Package (PoP) structures are an enabling technology for mobile devices, but they present unusual challenges in final test. Since the packaging technology is 3D, the test contactor must also take a multi-dimensional approach to the package. In final test applications a fairly standardized approach to the situation has been developed; while significant engineering challenges exist, methods for solving them are well known to top-tier socket manufacturers. System level and engineering characterization applications present much more diverse requirements, and require dynamic innovation in socketing. This paper describes the unusual requirements of contactors for final, system-level, and engineering characterization test in detail, and presents innovative solutions for resolving them.
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