S. Sundaresan, M. Marripelly, Svetlana Arshavsky, R. Singh
{"title":"15kv SiC引脚二极管达到95%的雪崩极限,长期稳定工作","authors":"S. Sundaresan, M. Marripelly, Svetlana Arshavsky, R. Singh","doi":"10.1109/ISPSD.2013.6694474","DOIUrl":null,"url":null,"abstract":"This paper reports on ultra-high voltage, >15 kV SiC PiN rectifiers exhibiting >95% of the avalanche rating and 115 V/μm. This is one of a few reports on > 15 kV blocking voltages measured on any single semiconductor device, and the highest percentage of the avalanche limit ever reported on devices fabricated on > 100 μm thick SiC epilayers. Excellent stability of on-state voltage drop (VF) is displayed by 5.76 mm2 and large-area, 41 mm2 PiN rectifiers, when continually biased at high current densities for several days. The impact of carrier lifetime on the device performance for SiC bipolar devices with ultra-thick (≥100 μm) base layers is investigated by comparing I-V-T characteristics of SiC PiN rectifiers fabricated on 100 μm and 130 μm thick epilayers.","PeriodicalId":175520,"journal":{"name":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"15 kV SiC PiN diodes achieve 95% of avalanche limit and stable long-term operation\",\"authors\":\"S. Sundaresan, M. Marripelly, Svetlana Arshavsky, R. Singh\",\"doi\":\"10.1109/ISPSD.2013.6694474\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports on ultra-high voltage, >15 kV SiC PiN rectifiers exhibiting >95% of the avalanche rating and 115 V/μm. This is one of a few reports on > 15 kV blocking voltages measured on any single semiconductor device, and the highest percentage of the avalanche limit ever reported on devices fabricated on > 100 μm thick SiC epilayers. Excellent stability of on-state voltage drop (VF) is displayed by 5.76 mm2 and large-area, 41 mm2 PiN rectifiers, when continually biased at high current densities for several days. The impact of carrier lifetime on the device performance for SiC bipolar devices with ultra-thick (≥100 μm) base layers is investigated by comparing I-V-T characteristics of SiC PiN rectifiers fabricated on 100 μm and 130 μm thick epilayers.\",\"PeriodicalId\":175520,\"journal\":{\"name\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2013.6694474\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2013.6694474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
15 kV SiC PiN diodes achieve 95% of avalanche limit and stable long-term operation
This paper reports on ultra-high voltage, >15 kV SiC PiN rectifiers exhibiting >95% of the avalanche rating and 115 V/μm. This is one of a few reports on > 15 kV blocking voltages measured on any single semiconductor device, and the highest percentage of the avalanche limit ever reported on devices fabricated on > 100 μm thick SiC epilayers. Excellent stability of on-state voltage drop (VF) is displayed by 5.76 mm2 and large-area, 41 mm2 PiN rectifiers, when continually biased at high current densities for several days. The impact of carrier lifetime on the device performance for SiC bipolar devices with ultra-thick (≥100 μm) base layers is investigated by comparing I-V-T characteristics of SiC PiN rectifiers fabricated on 100 μm and 130 μm thick epilayers.