{"title":"声学显微镜在非标准微电子封装结构表征中的应用","authors":"W. Lawton, J. Barrett","doi":"10.1109/ECTC.1997.606298","DOIUrl":null,"url":null,"abstract":"The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.","PeriodicalId":339633,"journal":{"name":"1997 Proceedings 47th Electronic Components and Technology Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The application of acoustic microscopy to the characterisation of non-standard microelectronic packaging structures\",\"authors\":\"W. Lawton, J. Barrett\",\"doi\":\"10.1109/ECTC.1997.606298\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.\",\"PeriodicalId\":339633,\"journal\":{\"name\":\"1997 Proceedings 47th Electronic Components and Technology Conference\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 Proceedings 47th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1997.606298\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings 47th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1997.606298","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The application of acoustic microscopy to the characterisation of non-standard microelectronic packaging structures
The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.