面向芯片的数字配电网目标阻抗设计

M. Tanaka, M. Toyama, H. Nakashima, J. Yamada, M. Haida, I. Ooshima
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引用次数: 6

摘要

近年来,随着半导体工艺技术的进步,噪声管理变得越来越困难。因此,配电网络(PDN)的设计显得尤为重要。本文介绍了目标阻抗的建立方法。关键技术是找到芯片正常工作的阻抗边线,并设置不超过该边线的目标阻抗。该方法产生的目标阻抗有助于优化设计余量和减小芯片/封装/电路板尺寸。从采用45纳米制程TEG芯片的实验结果来看,与未采用目标阻抗设计的原始设计相比,封装尺寸减小了21.5%,芯片尺寸减小了16.4%。通过实际测量,证实了芯片运行正常。另一方面,传统方法产生的目标阻抗无法找到工作设计模式。实验结果验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Chip oriented target impedance for digital power distribution network design
With the advancements in semiconductor process technologies in recent years, noise management has become more difficult. Therefore power distribution network (PDN) design has become more important. This paper describes the target impedance build method. The key techniques are to find the impedance border line of normal chip operation and to set the target impedance which does not exceed that border line. The target impedance which is produced by the proposed method is useful in optimizing the design margin and reducing the chip/package/board size. From the experimental result using a 45-nm process Test Element Group (TEG) chip, the package size was reduced by 21.5%, and the chip size was reduced by 16.4% in comparison with the original design which was not designed using the target impedance. Furthermore, normal chip operation was confirmed by the actual measurement. On the other hand, a working design pattern was not able to be found in the target impedance which was produced by the conventional method. The experimental result demonstrates the validation of the proposed method.
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