多层有机衬底上的嵌入式电阻和电容器的设计、制造和可靠性评估

K. Lee, S. Bhattacharya, M. Varadarajan, L. Wan, I. R. Abothu, V. Sundaram, P. Muthana, D. Balaraman, P. Raj, M. Swaminathan, S. Sitaraman, R. Tummala, P. Viswanadham, S. Dunford, J. Lauffer
{"title":"多层有机衬底上的嵌入式电阻和电容器的设计、制造和可靠性评估","authors":"K. Lee, S. Bhattacharya, M. Varadarajan, L. Wan, I. R. Abothu, V. Sundaram, P. Muthana, D. Balaraman, P. Raj, M. Swaminathan, S. Sitaraman, R. Tummala, P. Viswanadham, S. Dunford, J. Lauffer","doi":"10.1109/ISAPM.2005.1432084","DOIUrl":null,"url":null,"abstract":"Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based polymer thick film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JED EC standards are presented.","PeriodicalId":181674,"journal":{"name":"Proceedings. International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces, 2005.","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates\",\"authors\":\"K. Lee, S. Bhattacharya, M. Varadarajan, L. Wan, I. R. Abothu, V. Sundaram, P. Muthana, D. Balaraman, P. Raj, M. Swaminathan, S. Sitaraman, R. Tummala, P. Viswanadham, S. Dunford, J. Lauffer\",\"doi\":\"10.1109/ISAPM.2005.1432084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based polymer thick film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JED EC standards are presented.\",\"PeriodicalId\":181674,\"journal\":{\"name\":\"Proceedings. International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces, 2005.\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAPM.2005.1432084\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAPM.2005.1432084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

嵌入式无源为微电子微型化提供了一种实用的解决方案。在一个典型的电路中,超过80%的电子元件是无源的,如电阻、电感器和电容器,它们可能占据整个印刷电路板面积的50%。通过在基板内集成无源元件,嵌入式无源元件减少了系统占用空间,消除了对分立元件和组装元件的需求,提高了电气性能和可靠性,并有可能降低总体成本。此外,它是无铅的。尽管具有这些优势,嵌入式无源技术仍处于相对不成熟的阶段,需要更多的表征和优化才能实现实际应用,从而实现商业化。本文介绍了多层微孔有机衬底上嵌入式无源器件从设计、制造到电学特性和可靠性试验的全过程。封装研究中心(PRC)和恩迪科特互连技术公司(EI)设计并制造了两辆电阻器和电容器测试车。电阻器由碳墨基聚合物厚膜(PTF)和NiCrAlSi制成,电容器由聚合物/陶瓷纳米复合材料制成。对这些电容器进行了高频测量。在此基础上,提出了基于JED - EC标准的热冲击和温湿度试验的可靠性评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates
Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based polymer thick film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JED EC standards are presented.
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