D. Tran, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, H. Wunderlich
{"title":"纳米电子栅极设计中的宇称预测综合","authors":"D. Tran, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, H. Wunderlich","doi":"10.1109/TEST.2010.5699312","DOIUrl":null,"url":null,"abstract":"In this paper we investigate the possibility of using commercial synthesis tools to build parity predictors for nano-electronic gates designs. They will be used as redundant resources for robustness improvement for future CMOS technology nodes.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Parity prediction synthesis for nano-electronic gate designs\",\"authors\":\"D. Tran, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, H. Wunderlich\",\"doi\":\"10.1109/TEST.2010.5699312\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we investigate the possibility of using commercial synthesis tools to build parity predictors for nano-electronic gates designs. They will be used as redundant resources for robustness improvement for future CMOS technology nodes.\",\"PeriodicalId\":265156,\"journal\":{\"name\":\"2010 IEEE International Test Conference\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2010.5699312\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Parity prediction synthesis for nano-electronic gate designs
In this paper we investigate the possibility of using commercial synthesis tools to build parity predictors for nano-electronic gates designs. They will be used as redundant resources for robustness improvement for future CMOS technology nodes.