VLSI测试技术:为什么这个领域不够性感?

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI:10.1109/ETS.2012.6233047

S. Hamdioui, R. Aitken

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摘要

虽然它是任何制造芯片的组成部分，也是保证所需质量的关键步骤，但VLSI测试技术似乎对研究界变得不那么有吸引力/有趣。资助机构正在减少对该领域的资助，科学家正在转向其他热门话题，工业界没有认真支持该领域的学术界，等等。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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VLSI Test technology: Why is the field not sexy enough?

Although it is an integral part of any manufactured chip and a crucial step to guarantee the required quality, VLSI Test technology seems to become less attractive/interesting for the research community. Funding bodies are minimizing their funding in the area, scientists are moving to other hot topics, industry is not seriously supporting academia in the field, etc.

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2012 17th IEEE European Test Symposium (ETS)

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