使用商用现成评估板的集成电路重离子诱导单事件锁定筛选

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 1900-01-01 DOI:10.1109/NSREC.2016.7891717

G. Allen, F. Irom, L. Scheick, Sergeh Vartanian, Michael O'Connor

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引用次数: 4

摘要

我们介绍了用于低成本任务的各种商用现货(COTS)设备的重离子单事件锁定(SEL)筛选数据，并讨论了用于地面重离子测试的暴露模具的设备制备技术。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Heavy Ion Induced Single-Event Latchup Screening of Integrated Circuits Using Commercial Off-the-Shelf Evaluation Boards

We present heavy ion single-event latchup (SEL) screening data for a variety of commercial-off-the-shelf (COTS) devices intended for use on low-cost missions, and discuss the device preparation techniques used to expose the die for ground-based heavy-ion testing.

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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