FUNTEST:用于组合电路的功能自动测试图形生成器

Proceedings. 'Meeting the Tests of Time'., International Test Conference Pub Date : 1989-08-29 DOI:10.1109/TEST.1989.82397

S. Al-Arian, M. Nordenso

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引用次数: 3

摘要

研制了一种基于功能描述的组合电路自动测试图发生器(ATPG)。该算法基于一组布尔方程或更高级的函数表示生成测试，其中很少或根本不需要物理结构的知识。功能性故障覆盖是定义的，并与结构性故障覆盖相关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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FUNTEST: a functional automatic test pattern generator for combinational circuits

An automatic test pattern generator (ATPG) for combinational circuits based on a functional description has been developed. The algorithm generates tests on the basis of a set of Boolean equations or higher functional representations where little or no knowledge of the physical structure is required. A functional fault coverage is defined and related to structural fault coverage.<>

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Proceedings. 'Meeting the Tests of Time'., International Test Conference

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