基于抽象解释的嵌入式系统组成故障传播分析

C. Bartsch, Stephan Wilhelm, Daniel Kästner, D. Stoffel, W. Kunz
{"title":"基于抽象解释的嵌入式系统组成故障传播分析","authors":"C. Bartsch, Stephan Wilhelm, Daniel Kästner, D. Stoffel, W. Kunz","doi":"10.1109/ITC50571.2021.00057","DOIUrl":null,"url":null,"abstract":"Resilience against hardware faults is a major concern for safety-critical embedded systems which has been addressed in several standards. These standards demand a systematic and thorough safety evaluation, especially for the highest safety levels. In order to provide the data for this evaluation, we propose a scalable and formal approach to fault propagation analysis for hardware/software systems. We consider soft errors by single event upsets (SEUs) which corrupt data in hardware registers and examine their effect on the high-level software. Our method identifies all faults of a given fault list that can have an effect on selected objects of the high-level software, such as the specified safety functions, and gives formal guarantees for other faults that do not do any harm.Scalability of our approach results from combining an analysis at the binary and hardware level with an analysis of the high-level source code using Abstract Interpretation. The result is a mapping between a fault in the hardware and affected locations in the source code. Effectiveness and scalability of this method are demonstrated on an industry-oriented software system with about 138 k lines of C code.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Compositional Fault Propagation Analysis in Embedded Systems using Abstract Interpretation\",\"authors\":\"C. Bartsch, Stephan Wilhelm, Daniel Kästner, D. Stoffel, W. Kunz\",\"doi\":\"10.1109/ITC50571.2021.00057\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Resilience against hardware faults is a major concern for safety-critical embedded systems which has been addressed in several standards. These standards demand a systematic and thorough safety evaluation, especially for the highest safety levels. In order to provide the data for this evaluation, we propose a scalable and formal approach to fault propagation analysis for hardware/software systems. We consider soft errors by single event upsets (SEUs) which corrupt data in hardware registers and examine their effect on the high-level software. Our method identifies all faults of a given fault list that can have an effect on selected objects of the high-level software, such as the specified safety functions, and gives formal guarantees for other faults that do not do any harm.Scalability of our approach results from combining an analysis at the binary and hardware level with an analysis of the high-level source code using Abstract Interpretation. The result is a mapping between a fault in the hardware and affected locations in the source code. Effectiveness and scalability of this method are demonstrated on an industry-oriented software system with about 138 k lines of C code.\",\"PeriodicalId\":147006,\"journal\":{\"name\":\"2021 IEEE International Test Conference (ITC)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITC50571.2021.00057\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

对硬件故障的恢复能力是对安全至关重要的嵌入式系统的主要关注点,这已经在几个标准中得到了解决。这些标准要求进行系统和彻底的安全评估,特别是对最高安全级别的评估。为了提供这种评估的数据,我们提出了一种可扩展和形式化的方法来分析硬件/软件系统的故障传播。我们考虑了由单事件干扰(seu)引起的软错误,它破坏了硬件寄存器中的数据,并研究了它们对高级软件的影响。我们的方法识别给定故障列表中可能对高级软件的选定对象(如指定的安全功能)产生影响的所有故障,并对其他不造成任何危害的故障给出正式保证。我们方法的可扩展性来自于将二进制和硬件级别的分析与使用抽象解释的高级源代码分析相结合。结果是硬件中的故障与源代码中受影响的位置之间的映射。该方法的有效性和可扩展性在一个面向工业的软件系统上得到了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Compositional Fault Propagation Analysis in Embedded Systems using Abstract Interpretation
Resilience against hardware faults is a major concern for safety-critical embedded systems which has been addressed in several standards. These standards demand a systematic and thorough safety evaluation, especially for the highest safety levels. In order to provide the data for this evaluation, we propose a scalable and formal approach to fault propagation analysis for hardware/software systems. We consider soft errors by single event upsets (SEUs) which corrupt data in hardware registers and examine their effect on the high-level software. Our method identifies all faults of a given fault list that can have an effect on selected objects of the high-level software, such as the specified safety functions, and gives formal guarantees for other faults that do not do any harm.Scalability of our approach results from combining an analysis at the binary and hardware level with an analysis of the high-level source code using Abstract Interpretation. The result is a mapping between a fault in the hardware and affected locations in the source code. Effectiveness and scalability of this method are demonstrated on an industry-oriented software system with about 138 k lines of C code.
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