使用可转换互连的芯片级反逆向工程

Shuai Chen, Junlin Chen, Domenic Forte, J. Di, M. Tehranipoor, Lei Wang
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引用次数: 29

摘要

集成电路(IC)芯片的克隆已经成为半导体行业的重大威胁。未经授权从IC芯片中提取设计信息可以通过多种方式进行。侵入式方法是通过低成本的延迟加工,对芯片封装进行物理拆解,从而进入芯片的不同层。本文提出了一种利用可变换集成电路技术的新对策。可变形集成电路使用的材料不仅具有电子活性,而且在遭受侵入性攻击时还会改变其电气特性和物理成分。仿真结果表明,该方法在不引入较大性能开销的情况下,提高了芯片逆向工程的复杂度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Chip-level anti-reverse engineering using transformable interconnects
Cloning of integrated circuit (IC) chips have emerged as a significant threat to the semiconductor industry. Unauthorized extraction of design information from IC chips can be carried out in numerous ways. Invasive methods physically disassemble chip package and gain access to the different layers of a die through the low-cost delaying processing. This paper presents a new countermeasure exploiting transformable IC technologies. Transformable ICs are fabricated using materials that not only are electronically active but also change their electrical properties and physical compositions when experiencing invasive attacks. Simulation results demonstrate the proposed approach in improving the complexity of chip reverse engineering without introducing large performance overhead.
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