{"title":"可编程逻辑器件的测试和可测试性","authors":"J. VanDerwiele","doi":"10.1109/TEST.1989.82396","DOIUrl":null,"url":null,"abstract":"The author emphasizes that it is critical that thorough testing of programmable logic devices be included in the manufacturing process. Part of this testing is often done in the in-circuit test environment. It is concluded that testability must be programmed into these parts for successful in-circuit testing.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing and testability of programmable logic devices\",\"authors\":\"J. VanDerwiele\",\"doi\":\"10.1109/TEST.1989.82396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author emphasizes that it is critical that thorough testing of programmable logic devices be included in the manufacturing process. Part of this testing is often done in the in-circuit test environment. It is concluded that testability must be programmed into these parts for successful in-circuit testing.<<ETX>>\",\"PeriodicalId\":264111,\"journal\":{\"name\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1989.82396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testing and testability of programmable logic devices
The author emphasizes that it is critical that thorough testing of programmable logic devices be included in the manufacturing process. Part of this testing is often done in the in-circuit test environment. It is concluded that testability must be programmed into these parts for successful in-circuit testing.<>
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