Y. Maidon, Y. Deval, F. Verdier, J. Bégueret, J. Dom
{"title":"在线CMOS BICS的实验研究","authors":"Y. Maidon, Y. Deval, F. Verdier, J. Bégueret, J. Dom","doi":"10.1109/IDDQ.1997.633019","DOIUrl":null,"url":null,"abstract":"A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test chip highlight the behaviors of the sensor in terms of linearity, speed and noise.","PeriodicalId":429650,"journal":{"name":"Digest of Papers IEEE International Workshop on IDDQ Testing","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"On-line CMOS BICS: an experimental study\",\"authors\":\"Y. Maidon, Y. Deval, F. Verdier, J. Bégueret, J. Dom\",\"doi\":\"10.1109/IDDQ.1997.633019\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test chip highlight the behaviors of the sensor in terms of linearity, speed and noise.\",\"PeriodicalId\":429650,\"journal\":{\"name\":\"Digest of Papers IEEE International Workshop on IDDQ Testing\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers IEEE International Workshop on IDDQ Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDDQ.1997.633019\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers IEEE International Workshop on IDDQ Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDDQ.1997.633019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A CMOS built-in current sensor is proposed. It is dedicated to mixed signal circuits power supply current monitoring. It takes advantage of a parasitic resistor, so its implementation is very transparent. Measurement results of a manufactured test chip highlight the behaviors of the sensor in terms of linearity, speed and noise.
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