{"title":"电路高级描述的新可测试性措施","authors":"M. Gentil, D. Crestani, A. Rhalibi, C. Durante","doi":"10.1109/ATW.1994.747842","DOIUrl":null,"url":null,"abstract":"This paper proposes high level testabillty measures based on constraints propagation approach and symbolic fault modelling. These measures are compared with some others on a circuit example poinung out their accunacy to show the circuit areas which are difficult to test.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New Testability Measures For High Level Description Of Circuits\",\"authors\":\"M. Gentil, D. Crestani, A. Rhalibi, C. Durante\",\"doi\":\"10.1109/ATW.1994.747842\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes high level testabillty measures based on constraints propagation approach and symbolic fault modelling. These measures are compared with some others on a circuit example poinung out their accunacy to show the circuit areas which are difficult to test.\",\"PeriodicalId\":217615,\"journal\":{\"name\":\"The Third Annual Atlantic Test Workshop\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Third Annual Atlantic Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATW.1994.747842\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747842","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New Testability Measures For High Level Description Of Circuits
This paper proposes high level testabillty measures based on constraints propagation approach and symbolic fault modelling. These measures are compared with some others on a circuit example poinung out their accunacy to show the circuit areas which are difficult to test.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
