超薄柔性100 V Chipfilm™N-LDMOS

A. Asif, H. Richter, C. Comtesse, J. Burghartz
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引用次数: 0

摘要

系统箔(SiF)技术需要低成本、超薄和高性能的高压晶体管,以满足许多新兴柔性显示技术对高压驱动能力的需求。提出了一种基于Chipfilm™技术的超薄(20 μm) n型横向DMOS晶体管(N-LDMOS)。该制造工艺与使用浅沟槽隔离(STI)的传统高压CMOS技术完全兼容。在沟道长度为9 μm,宽度为50 μm时,N-LDMOS的击穿电压>100伏,最大漏极电流为4.4 mA。在漏极电压Vds = 100 V时,相对于没有自加热的漏极电流,自加热导致硅载体晶片上的漏极电流减少19%,聚酰亚胺(PI)箔上的漏极电流减少35%,因此表明功耗是柔性电子产品中最严重的问题之一。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultra-thin flexible 100 V Chipfilm™ N-LDMOS
System-in-foil (SiF) technology calls for low cost, ultra-thin and, high-performance high-voltage transistors to satisfy the need for high-voltage driving capability in many of the emerging flexible display technologies. An ultra-thin (20 μm) N-type lateral DMOS transistor (N-LDMOS) in Chipfilm™ technology, developed for this application, is presented. The fabrication process is fully compatible with conventional high-voltage CMOS technology using shallow trench isolation (STI). The N-LDMOS has a breakdown voltage >100 volts with a maximum drain current of 4.4 mA at a channel length of 9 μm and a width of 50 μm. At drain voltage Vds = 100 V, self-heating causes a reduction in drain current up to 19% on a silicon carrier wafer and 35% on polyimide (PI) foil relative to the drain current without self heating, thus indicating power dissipation to be one of most serious issues in flexible electronics.
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