未扫描互连的证候模拟和证候测试

Proceedings of the Fifth Asian Test Symposium (ATS'96) Pub Date : 1996-11-20 DOI:10.1109/ATS.1996.555138

C. Su, Shyh-Shen Hwang, S. Jou, Y. Ting

{"title":"未扫描互连的证候模拟和证候测试","authors":"C. Su, Shyh-Shen Hwang, S. Jou, Y. Ting","doi":"10.1109/ATS.1996.555138","DOIUrl":null,"url":null,"abstract":"In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, fault-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solve the problem as a set covering problem.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Syndrome simulation and syndrome test for unscanned interconnects\",\"authors\":\"C. Su, Shyh-Shen Hwang, S. Jou, Y. Ting\",\"doi\":\"10.1109/ATS.1996.555138\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, fault-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solve the problem as a set covering problem.\",\"PeriodicalId\":215252,\"journal\":{\"name\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1996.555138\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

在本文中，我们提出了一种在边界扫描环境中测试未扫描互连的综合征测试方法。推导了试验长度、无故障综合征和故障综合征与可容忍错误率之间关系的数学方程。为了计算无故障和故障证候，我们提出了一种事件驱动证候模拟算法。为了缩短测试时间和降低测试成本，我们将问题转化为集合覆盖问题来解决。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Syndrome simulation and syndrome test for unscanned interconnects

In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, fault-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solve the problem as a set covering problem.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the Fifth Asian Test Symposium (ATS'96)

自引率

0.00%

发文量