Ru Huang, Xing Zhang, Yue Xi, Y. Li, Yangyuan Wang
{"title":"Back-gate bias effect in the SOI gate controlled hybrid transistor (GCHT)","authors":"Ru Huang, Xing Zhang, Yue Xi, Y. Li, Yangyuan Wang","doi":"10.1109/HKEDM.1997.642355","DOIUrl":null,"url":null,"abstract":"Back-gate bias effect in SOI gate controlled hybrid transistor is discussed. Experimental results show the transconductance enhancement caused by the back-gate bias. Furthermore, the back-gate effect is alleviated in GCHT compared with conventional MOSFET.","PeriodicalId":262767,"journal":{"name":"1997 IEEE Hong Kong Proceedings Electron Devices Meeting","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Hong Kong Proceedings Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HKEDM.1997.642355","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Back-gate bias effect in the SOI gate controlled hybrid transistor (GCHT)
Back-gate bias effect in SOI gate controlled hybrid transistor is discussed. Experimental results show the transconductance enhancement caused by the back-gate bias. Furthermore, the back-gate effect is alleviated in GCHT compared with conventional MOSFET.