随机存取存储器中脉冲加热导电灯丝的非扩散散热

K. Regner, J. Malen
{"title":"随机存取存储器中脉冲加热导电灯丝的非扩散散热","authors":"K. Regner, J. Malen","doi":"10.1109/IRPS.2016.7574544","DOIUrl":null,"url":null,"abstract":"Here, we discuss experimental and theoretical studies of nondiffusive thermal transport, which occurs when geometrical length scales are comparable to energy carrier mean free paths (MFPs). We expand upon a previous study that emphasizes the importance of nondiffusive thermal transport in resistive-switching random access memory (RRAM). To model this behavior, an approximate solution to the Boltzmann transport equation (BTE), under the relaxation time approximation in the cylindrical geometry, is derived for the case of an arbitrary, temporally periodic surface temperature boundary condition. This boundary condition coupled with the BTE more realistically models switching stimuli in an RRAM device.","PeriodicalId":172129,"journal":{"name":"2016 IEEE International Reliability Physics Symposium (IRPS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nondiffusive heat dissipation from a pulse-heated conductive filament in RRAM\",\"authors\":\"K. Regner, J. Malen\",\"doi\":\"10.1109/IRPS.2016.7574544\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Here, we discuss experimental and theoretical studies of nondiffusive thermal transport, which occurs when geometrical length scales are comparable to energy carrier mean free paths (MFPs). We expand upon a previous study that emphasizes the importance of nondiffusive thermal transport in resistive-switching random access memory (RRAM). To model this behavior, an approximate solution to the Boltzmann transport equation (BTE), under the relaxation time approximation in the cylindrical geometry, is derived for the case of an arbitrary, temporally periodic surface temperature boundary condition. This boundary condition coupled with the BTE more realistically models switching stimuli in an RRAM device.\",\"PeriodicalId\":172129,\"journal\":{\"name\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2016.7574544\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2016.7574544","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文讨论了当几何长度尺度与载流子平均自由程(MFPs)相当时发生的非扩散热输运的实验和理论研究。我们扩展了先前的研究,强调了非扩散热传输在电阻开关随机存取存储器(RRAM)中的重要性。为了模拟这种行为,在柱面几何中的松弛时间近似下,导出了任意时间周期表面温度边界条件下玻尔兹曼输运方程(BTE)的近似解。该边界条件与BTE相结合,更真实地模拟了RRAM器件中的开关刺激。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nondiffusive heat dissipation from a pulse-heated conductive filament in RRAM
Here, we discuss experimental and theoretical studies of nondiffusive thermal transport, which occurs when geometrical length scales are comparable to energy carrier mean free paths (MFPs). We expand upon a previous study that emphasizes the importance of nondiffusive thermal transport in resistive-switching random access memory (RRAM). To model this behavior, an approximate solution to the Boltzmann transport equation (BTE), under the relaxation time approximation in the cylindrical geometry, is derived for the case of an arbitrary, temporally periodic surface temperature boundary condition. This boundary condition coupled with the BTE more realistically models switching stimuli in an RRAM device.
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