采用3.3 v CMOS器件的高性能0.5 μ m BiCMOS技术

E. D. Johnson, T. Hook, J. Bertsch, Y. Taur, C. Chen, H.J. Shin, S. Ramaswamy, A. Edenfeld, C. Alcorn
{"title":"采用3.3 v CMOS器件的高性能0.5 μ m BiCMOS技术","authors":"E. D. Johnson, T. Hook, J. Bertsch, Y. Taur, C. Chen, H.J. Shin, S. Ramaswamy, A. Edenfeld, C. Alcorn","doi":"10.1109/VLSIT.1990.111022","DOIUrl":null,"url":null,"abstract":"A BiCMOS technology is described that is built on an optimized 3.3-V 0.5-μm CMOS base process. A high-performance single-polysilicon npn transistor with a cutoff frequency of 15 GHz is integrated using CMOS-compatible heat cycles. Novel level-shifted BiCMOS circuit techniques are employed to allow the bipolar devices to operate at a higher voltage (4.1 V) without performance degradation while keeping the CMOS devices at 3.3 V for reliable operation. With such a circuit, performance gain over CMOS is achieved at a reduced channel length and voltage. This demonstrates the feasibility of scaling BiCMOS technology to reduced channel length and power supply voltage","PeriodicalId":441541,"journal":{"name":"Digest of Technical Papers.1990 Symposium on VLSI Technology","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A high-performance 0.5-μm BiCMOS technology with 3.3-V CMOS devices\",\"authors\":\"E. D. Johnson, T. Hook, J. Bertsch, Y. Taur, C. Chen, H.J. Shin, S. Ramaswamy, A. Edenfeld, C. Alcorn\",\"doi\":\"10.1109/VLSIT.1990.111022\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A BiCMOS technology is described that is built on an optimized 3.3-V 0.5-μm CMOS base process. A high-performance single-polysilicon npn transistor with a cutoff frequency of 15 GHz is integrated using CMOS-compatible heat cycles. Novel level-shifted BiCMOS circuit techniques are employed to allow the bipolar devices to operate at a higher voltage (4.1 V) without performance degradation while keeping the CMOS devices at 3.3 V for reliable operation. With such a circuit, performance gain over CMOS is achieved at a reduced channel length and voltage. This demonstrates the feasibility of scaling BiCMOS technology to reduced channel length and power supply voltage\",\"PeriodicalId\":441541,\"journal\":{\"name\":\"Digest of Technical Papers.1990 Symposium on VLSI Technology\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Technical Papers.1990 Symposium on VLSI Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIT.1990.111022\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Technical Papers.1990 Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.1990.111022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

介绍了一种基于优化的3.3 v 0.5 μ m CMOS基制程的BiCMOS技术。一个高性能的单多晶硅npn晶体管的截止频率为15 GHz,集成了cmos兼容的热循环。采用新颖的电平移位BiCMOS电路技术,使双极器件在更高的电压(4.1 V)下工作而不降低性能,同时将CMOS器件保持在3.3 V以可靠运行。使用这样的电路,可以在减少通道长度和电压的情况下获得优于CMOS的性能增益。这证明了缩小BiCMOS技术以减小通道长度和电源电压的可行性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A high-performance 0.5-μm BiCMOS technology with 3.3-V CMOS devices
A BiCMOS technology is described that is built on an optimized 3.3-V 0.5-μm CMOS base process. A high-performance single-polysilicon npn transistor with a cutoff frequency of 15 GHz is integrated using CMOS-compatible heat cycles. Novel level-shifted BiCMOS circuit techniques are employed to allow the bipolar devices to operate at a higher voltage (4.1 V) without performance degradation while keeping the CMOS devices at 3.3 V for reliable operation. With such a circuit, performance gain over CMOS is achieved at a reduced channel length and voltage. This demonstrates the feasibility of scaling BiCMOS technology to reduced channel length and power supply voltage
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信