{"title":"非抛物带结构对4H-SiC反转层量子约束电子态的影响","authors":"Ryuta Watanabe, Y. Kamakura","doi":"10.1109/IMFEDK.2013.6602236","DOIUrl":null,"url":null,"abstract":"We calculate two dimensional electronic states in 4H-SiC inversion layers based on empirical pseudopotential approach, and the nonparabolicity effects on the quantum confinement are discussed. It is shown that the in-plane effective mass for electrons significantly increases under the strong confinement conditions in the case of (0001) oriented substrate, eventually causing the degradation of the inversion layer mobility.","PeriodicalId":434595,"journal":{"name":"2013 IEEE International Meeting for Future of Electron Devices, Kansai","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of non-parabolic band structure on quantum confined electronic states in 4H-SiC inversion layers\",\"authors\":\"Ryuta Watanabe, Y. Kamakura\",\"doi\":\"10.1109/IMFEDK.2013.6602236\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We calculate two dimensional electronic states in 4H-SiC inversion layers based on empirical pseudopotential approach, and the nonparabolicity effects on the quantum confinement are discussed. It is shown that the in-plane effective mass for electrons significantly increases under the strong confinement conditions in the case of (0001) oriented substrate, eventually causing the degradation of the inversion layer mobility.\",\"PeriodicalId\":434595,\"journal\":{\"name\":\"2013 IEEE International Meeting for Future of Electron Devices, Kansai\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Meeting for Future of Electron Devices, Kansai\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMFEDK.2013.6602236\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Meeting for Future of Electron Devices, Kansai","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK.2013.6602236","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of non-parabolic band structure on quantum confined electronic states in 4H-SiC inversion layers
We calculate two dimensional electronic states in 4H-SiC inversion layers based on empirical pseudopotential approach, and the nonparabolicity effects on the quantum confinement are discussed. It is shown that the in-plane effective mass for electrons significantly increases under the strong confinement conditions in the case of (0001) oriented substrate, eventually causing the degradation of the inversion layer mobility.