M. Natarajan, S. Thijs, D. Trémouilles, D. Linten, N. Collaert, M. Jurczak, G. Groeseneken
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From the design point of view, while such technology options may result in increased transistor performance, the ability to achieve sufficient product reliability is to be addressed. Among the industry accepted reliability requirements, electrostatic discharge (ESD) reliability assessment is the focus of this work.
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