{"title":"基于解调的片外驱动性能测试","authors":"W. Daehn","doi":"10.1109/ETW.2001.946660","DOIUrl":null,"url":null,"abstract":"This paper presents a new technique for testing the performance of offchip rivers (OCDs). It is based on the use of periodic signals and a demodulation base analysis in the frequency domain The technique is particular useful for replacing expensive time domain tests of OCD performance by simpler and less expensive phase shift measurements in the frequency domain.Such tests can easily be performed by low cost external test circuitry or low cost ATE.","PeriodicalId":339694,"journal":{"name":"IEEE European Test Workshop, 2001.","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Demodulation based testing of off-chip driver performance\",\"authors\":\"W. Daehn\",\"doi\":\"10.1109/ETW.2001.946660\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new technique for testing the performance of offchip rivers (OCDs). It is based on the use of periodic signals and a demodulation base analysis in the frequency domain The technique is particular useful for replacing expensive time domain tests of OCD performance by simpler and less expensive phase shift measurements in the frequency domain.Such tests can easily be performed by low cost external test circuitry or low cost ATE.\",\"PeriodicalId\":339694,\"journal\":{\"name\":\"IEEE European Test Workshop, 2001.\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE European Test Workshop, 2001.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETW.2001.946660\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE European Test Workshop, 2001.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETW.2001.946660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Demodulation based testing of off-chip driver performance
This paper presents a new technique for testing the performance of offchip rivers (OCDs). It is based on the use of periodic signals and a demodulation base analysis in the frequency domain The technique is particular useful for replacing expensive time domain tests of OCD performance by simpler and less expensive phase shift measurements in the frequency domain.Such tests can easily be performed by low cost external test circuitry or low cost ATE.