{"title":"高效高湿高温反向偏置测试作为电力电子模块重要鉴定方法的创新方法","authors":"M. Mueller, J. Franke","doi":"10.1109/EPTC.2018.8654395","DOIUrl":null,"url":null,"abstract":"The field of today’s power electronics is exposed to continuously increasing requirements. Key issues such as energy efficiency, cost savings and reliability with a simultaneous increase of power represent the new challenges. By innovative wideband gap semiconductor technologies, copper wire bonding, and silver sintered or diffusion soldered layers for die-attach higher temperature limits and current densities can still be realized. In the course of this power modules must be protected against fatigue. In particular these high stresses affect the reliability of modules and therefore the life time.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Innovative Approach of efficient High Humidity and High Temperature Reverse Bias Testing as significant Qualification Method for Power Electronic Modules\",\"authors\":\"M. Mueller, J. Franke\",\"doi\":\"10.1109/EPTC.2018.8654395\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The field of today’s power electronics is exposed to continuously increasing requirements. Key issues such as energy efficiency, cost savings and reliability with a simultaneous increase of power represent the new challenges. By innovative wideband gap semiconductor technologies, copper wire bonding, and silver sintered or diffusion soldered layers for die-attach higher temperature limits and current densities can still be realized. In the course of this power modules must be protected against fatigue. In particular these high stresses affect the reliability of modules and therefore the life time.\",\"PeriodicalId\":360239,\"journal\":{\"name\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2018.8654395\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654395","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Innovative Approach of efficient High Humidity and High Temperature Reverse Bias Testing as significant Qualification Method for Power Electronic Modules
The field of today’s power electronics is exposed to continuously increasing requirements. Key issues such as energy efficiency, cost savings and reliability with a simultaneous increase of power represent the new challenges. By innovative wideband gap semiconductor technologies, copper wire bonding, and silver sintered or diffusion soldered layers for die-attach higher temperature limits and current densities can still be realized. In the course of this power modules must be protected against fatigue. In particular these high stresses affect the reliability of modules and therefore the life time.