{"title":"销钉裕度分析","authors":"R. E. Huston","doi":"10.1109/TEST.1997.639677","DOIUrl":null,"url":null,"abstract":"A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Pin margin analysis\",\"authors\":\"R. E. Huston\",\"doi\":\"10.1109/TEST.1997.639677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639677\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins.
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