测试生成并行处理的性能分析

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367251

T. Inoue, T. Fujii, H. Fujiwara

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引用次数: 3

摘要

测试生成并行处理的性能取决于处理器之间的通信方式。本文介绍了两种不同通信方式的并行处理，并对其性能进行了分析。给出了并行处理中得到的测试向量的个数，并分析了测试生成、故障模拟和处理器间通信的成本和加速比。此外，我们还考虑了一种最小化处理器间通信开销的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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On the performance analysis of parallel processing for test generation

The performance of parallel processing for test generation depends on the method of communication among processors. This paper presents two types of parallel processing which differ in communication methods, and analyzes their performance. We formulate the number of test vectors obtained in parallel processing, and analyze the costs of test generation, fault simulation and interprocessor communication and the speedup ratio. Further, we consider a method which minimizes the cost of interprocessor communication.<>

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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