基于硬件的逻辑软误差截面预测经验模型

2016 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2016-04-17 DOI:10.1109/IRPS.2016.7574518

S. Jagannathan, N. Mahatme, N. Gaspard, T. D. Loveless, B. Bhuva, L. Massengill

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引用次数: 2

摘要

本文提出了一种利用辐射实验中测量的单事件瞬态脉冲宽度来估计逻辑截面的技术。通过与C-CREST电路直接测量的逻辑截面进行对比，验证了结果的正确性。由于逻辑截面是基于实验测量的瞬态提取的，因此它包含了器件/布局级效应，可以通过现有的基于软件的方法来准确预测逻辑软错误率。

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Hardware based empirical model for predicting logic soft error cross-section

This work presents a technique to estimate logic cross-section using measured single-event transient pulse widths from radiation experiments. The results are verified by comparing against direct measurement of logic cross-section using C-CREST circuit. Since the logic cross-section is extracted based on experimentally measured transients, it includes device/layout level effects and could be used by existing software-based methods to accurately predict logic soft error rate.

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2016 IEEE International Reliability Physics Symposium (IRPS)

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