Jonas Stricker, C. Kain, Andi Buzo, Jérôme Kirscher, L. Maurer, G. Pelz
{"title":"汽车智能电源产品在电动助力转向应用中的故障影响评估","authors":"Jonas Stricker, C. Kain, Andi Buzo, Jérôme Kirscher, L. Maurer, G. Pelz","doi":"10.1109/SMICND.2018.8539772","DOIUrl":null,"url":null,"abstract":"The paper presents a methodology to propagate the consequences of random hardware faults in automotive smart power products to the application level. To accomplish this, the random hardware faults on chip level are assessed through fault injection into circuit simulations and are collapsed to come up with the relevant fault modes of a certain chip block. Then, these fault modes are propagated to the application level by injecting them into application simulations. The above is accomplished in an automated, seamless flow, which supports the engineering judgment in safety analysis by simulation results. The viability of the proposed approach is shown along a real-life example application (electric power steering) and a related smart power function (current measurement in the three phases). 1","PeriodicalId":247062,"journal":{"name":"2018 International Semiconductor Conference (CAS)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fault Impact Assessment for Automotive Smart Power Products in an Electric Power Steering Application\",\"authors\":\"Jonas Stricker, C. Kain, Andi Buzo, Jérôme Kirscher, L. Maurer, G. Pelz\",\"doi\":\"10.1109/SMICND.2018.8539772\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a methodology to propagate the consequences of random hardware faults in automotive smart power products to the application level. To accomplish this, the random hardware faults on chip level are assessed through fault injection into circuit simulations and are collapsed to come up with the relevant fault modes of a certain chip block. Then, these fault modes are propagated to the application level by injecting them into application simulations. The above is accomplished in an automated, seamless flow, which supports the engineering judgment in safety analysis by simulation results. The viability of the proposed approach is shown along a real-life example application (electric power steering) and a related smart power function (current measurement in the three phases). 1\",\"PeriodicalId\":247062,\"journal\":{\"name\":\"2018 International Semiconductor Conference (CAS)\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Semiconductor Conference (CAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2018.8539772\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2018.8539772","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault Impact Assessment for Automotive Smart Power Products in an Electric Power Steering Application
The paper presents a methodology to propagate the consequences of random hardware faults in automotive smart power products to the application level. To accomplish this, the random hardware faults on chip level are assessed through fault injection into circuit simulations and are collapsed to come up with the relevant fault modes of a certain chip block. Then, these fault modes are propagated to the application level by injecting them into application simulations. The above is accomplished in an automated, seamless flow, which supports the engineering judgment in safety analysis by simulation results. The viability of the proposed approach is shown along a real-life example application (electric power steering) and a related smart power function (current measurement in the three phases). 1