2018 International Semiconductor Conference (CAS)

MOS Dosimeter Based on Ge Nanocrystals in Hfo2

Pub Date : 2018-10-01 DOI: 10.1109/SMICND.2018.8539769 C. Palade, A. Slav, A. Lepadatu, I. Stavarache, I. Dascalescu, O. Cojocaru, T. Stoica, M. Ciurea, S. Lazanu

Power Supply Duty Cycling for Highly Constrained IoT Devices

Pub Date : 2018-10-01 DOI: 10.1109/SMICND.2018.8539832 A. Monti, E. Alata, D. Dragomirescu, A. Takacs

Substrate Effect on the Morphology and Optical Properties of ZnO Nanorods Layers Grown by Microwave-Assisted Hydrothermal Method

Pub Date : 2018-10-01 DOI: 10.1109/SMICND.2018.8539811 A. Filip, V. Muşat, N. Țigău, A. Cantaragiu, C. Romanițan, M. Purica