{"title":"导体表面积分方程建模的研究","authors":"T. Xia, H. Gan, M. Wei, W. Chew","doi":"10.1109/EPEPS.2015.7347146","DOIUrl":null,"url":null,"abstract":"A rigorous method to solve conductor problems using the surface integral equation is introduced. This formulation is based on the augmented electric field integral equation. In order to model conductors and accurately capture the losses, some integration techniques are analyzed and compared. The line integral method will be an optimal option for conductor problems. After incorporating this technique, this method can be applied to interconnect and packaging problems.","PeriodicalId":130864,"journal":{"name":"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"227 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A study of conductor modeling using the surface integral equation\",\"authors\":\"T. Xia, H. Gan, M. Wei, W. Chew\",\"doi\":\"10.1109/EPEPS.2015.7347146\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A rigorous method to solve conductor problems using the surface integral equation is introduced. This formulation is based on the augmented electric field integral equation. In order to model conductors and accurately capture the losses, some integration techniques are analyzed and compared. The line integral method will be an optimal option for conductor problems. After incorporating this technique, this method can be applied to interconnect and packaging problems.\",\"PeriodicalId\":130864,\"journal\":{\"name\":\"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"227 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2015.7347146\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2015.7347146","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A study of conductor modeling using the surface integral equation
A rigorous method to solve conductor problems using the surface integral equation is introduced. This formulation is based on the augmented electric field integral equation. In order to model conductors and accurately capture the losses, some integration techniques are analyzed and compared. The line integral method will be an optimal option for conductor problems. After incorporating this technique, this method can be applied to interconnect and packaging problems.