K. Kurobe, Y. Ishikawa, K. Kagawa, Y. Niwatsukino, A. Matusno, K. Shibahara
{"title":"热辅助准分子激光退火制备低阻超浅n+/p结","authors":"K. Kurobe, Y. Ishikawa, K. Kagawa, Y. Niwatsukino, A. Matusno, K. Shibahara","doi":"10.1109/IWJT.2002.1225194","DOIUrl":null,"url":null,"abstract":"Low-resistive ultra-shallow n/sup +//p junctions were formed with Sb by a heat-assisted laser annealing method. A wide process window for laser energy density and heating temperature was obtained. Under that condition, Sb diffusion was small and did not affect junction depth. The obtained sheet resistance was about 540/spl Omega///spl square/ for junction depth of 21 nm.","PeriodicalId":300554,"journal":{"name":"Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT.","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Formation of low-resistive ultra-shallow n+/p junction by heat-assisted excimer laser annealing\",\"authors\":\"K. Kurobe, Y. Ishikawa, K. Kagawa, Y. Niwatsukino, A. Matusno, K. Shibahara\",\"doi\":\"10.1109/IWJT.2002.1225194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low-resistive ultra-shallow n/sup +//p junctions were formed with Sb by a heat-assisted laser annealing method. A wide process window for laser energy density and heating temperature was obtained. Under that condition, Sb diffusion was small and did not affect junction depth. The obtained sheet resistance was about 540/spl Omega///spl square/ for junction depth of 21 nm.\",\"PeriodicalId\":300554,\"journal\":{\"name\":\"Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT.\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWJT.2002.1225194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the Third International Workshop on Junction Technology, 2002. IWJT.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWJT.2002.1225194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Formation of low-resistive ultra-shallow n+/p junction by heat-assisted excimer laser annealing
Low-resistive ultra-shallow n/sup +//p junctions were formed with Sb by a heat-assisted laser annealing method. A wide process window for laser energy density and heating temperature was obtained. Under that condition, Sb diffusion was small and did not affect junction depth. The obtained sheet resistance was about 540/spl Omega///spl square/ for junction depth of 21 nm.