{"title":"GMR传感器在HBM和CDM瞬态下的热响应比较","authors":"Yizhang Yang, M. Asheghi","doi":"10.1109/EOSESD.2004.5272586","DOIUrl":null,"url":null,"abstract":"The thermal response of the GMR sensor during the ESD pulse is investigated using finite element model. The simulation compares the transient temperature rise in GMR sensor when they are subjected to the Human Body Model (HBM) and Charged-Device Model (CDM) waveforms. The results indicate that the ESD threshold damage for GMR head depends on both the thermal time constant and the ESD transient current.","PeriodicalId":302866,"journal":{"name":"2004 Electrical Overstress/Electrostatic Discharge Symposium","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparison of thermal response of GMR sensor subjected to HBM and CDM transients\",\"authors\":\"Yizhang Yang, M. Asheghi\",\"doi\":\"10.1109/EOSESD.2004.5272586\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The thermal response of the GMR sensor during the ESD pulse is investigated using finite element model. The simulation compares the transient temperature rise in GMR sensor when they are subjected to the Human Body Model (HBM) and Charged-Device Model (CDM) waveforms. The results indicate that the ESD threshold damage for GMR head depends on both the thermal time constant and the ESD transient current.\",\"PeriodicalId\":302866,\"journal\":{\"name\":\"2004 Electrical Overstress/Electrostatic Discharge Symposium\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 Electrical Overstress/Electrostatic Discharge Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2004.5272586\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Electrical Overstress/Electrostatic Discharge Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2004.5272586","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparison of thermal response of GMR sensor subjected to HBM and CDM transients
The thermal response of the GMR sensor during the ESD pulse is investigated using finite element model. The simulation compares the transient temperature rise in GMR sensor when they are subjected to the Human Body Model (HBM) and Charged-Device Model (CDM) waveforms. The results indicate that the ESD threshold damage for GMR head depends on both the thermal time constant and the ESD transient current.