基于逻辑信息的快速桥接故障诊断

A. Rousset, A. Bosio, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel
{"title":"基于逻辑信息的快速桥接故障诊断","authors":"A. Rousset, A. Bosio, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel","doi":"10.1109/ATS.2007.75","DOIUrl":null,"url":null,"abstract":"In this paper, we present a diagnosis methodology targeting the whole set of bridging faults leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts only to logic information provided by the tester without requiring a detailed description of the fault models. It is based on an Effect-Cause analysis providing a ranked list of suspects always including the root cause of the observed error. Experimental results on benchmarks ISCAS'89 and ITC '99 show the efficiency of the proposed solution in terms of diagnosis resolution and required computational time.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Fast Bridging Fault Diagnosis using Logic Information\",\"authors\":\"A. Rousset, A. Bosio, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel\",\"doi\":\"10.1109/ATS.2007.75\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a diagnosis methodology targeting the whole set of bridging faults leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts only to logic information provided by the tester without requiring a detailed description of the fault models. It is based on an Effect-Cause analysis providing a ranked list of suspects always including the root cause of the observed error. Experimental results on benchmarks ISCAS'89 and ITC '99 show the efficiency of the proposed solution in terms of diagnosis resolution and required computational time.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.75\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.75","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

在本文中,我们提出了一种针对导致静态或动态故障行为的整个桥接故障集的诊断方法。所采用的诊断算法仅依赖于测试人员提供的逻辑信息,而不需要对故障模型进行详细描述。它基于因果分析,该分析提供了嫌疑犯的排序列表,其中总是包括观察到的错误的根本原因。在ISCAS'89和ITC '99基准上的实验结果表明,该方法在诊断分辨率和所需计算时间方面是有效的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fast Bridging Fault Diagnosis using Logic Information
In this paper, we present a diagnosis methodology targeting the whole set of bridging faults leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts only to logic information provided by the tester without requiring a detailed description of the fault models. It is based on an Effect-Cause analysis providing a ranked list of suspects always including the root cause of the observed error. Experimental results on benchmarks ISCAS'89 and ITC '99 show the efficiency of the proposed solution in terms of diagnosis resolution and required computational time.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信