{"title":"基于神经网络的超陡亚阈边坡装置建模","authors":"K. Nakata, Takayuki Mori, J. Ida","doi":"10.1109/IMFEDK56875.2022.9975367","DOIUrl":null,"url":null,"abstract":"In this study, the characteristics modeling of a PN-body tied silicon on insulator field-effect transistor, which has super steep subthreshold slope (SS) (less than 10 mV/dec) characteristics, was tried by using a neural network. We found that four or more hidden layers are needed to express the super steep SS.","PeriodicalId":162017,"journal":{"name":"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","volume":"169 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling of Super Steep Subthreshold Slope Device by using Neural Network\",\"authors\":\"K. Nakata, Takayuki Mori, J. Ida\",\"doi\":\"10.1109/IMFEDK56875.2022.9975367\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, the characteristics modeling of a PN-body tied silicon on insulator field-effect transistor, which has super steep subthreshold slope (SS) (less than 10 mV/dec) characteristics, was tried by using a neural network. We found that four or more hidden layers are needed to express the super steep SS.\",\"PeriodicalId\":162017,\"journal\":{\"name\":\"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)\",\"volume\":\"169 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-11-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMFEDK56875.2022.9975367\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK56875.2022.9975367","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of Super Steep Subthreshold Slope Device by using Neural Network
In this study, the characteristics modeling of a PN-body tied silicon on insulator field-effect transistor, which has super steep subthreshold slope (SS) (less than 10 mV/dec) characteristics, was tried by using a neural network. We found that four or more hidden layers are needed to express the super steep SS.