G. Srinivasan, A. Chatterjee, Vishwanath Natarajan
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Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources
At the present time, coordinated EDA tools for RF/mixed-signal pin test do not exist. In this paper, a CAD tool for efficient production testing of high- performance RF systems using low-cost baseband ATE is presented The CAD tool consists of a custom developed genetic ATPG for spectral (Fourier spectrum) signature-based alternate (to full specification-based tests) test of RF systems and involves co-simulation of scalable behavioral-level models of the RF System-Under-Test, baseband ATE test instrumentation, loadboard resources, and DfT resources for fast test vector optimization/generation. The CAD tool also enables the evaluation of various low-cost ATE architectures on the impact of the generated tests to provide a cost-effective solution.
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