{"title":"开关电池旁路网络阻抗的研究——去耦电容位置的影响","authors":"Y. Pascal, D. Labrousse, M. Petit, F. Costa","doi":"10.1109/IWIPP.2019.8799093","DOIUrl":null,"url":null,"abstract":"Mechanisms responsible for ringing and oscillations in power converters at transistors turn-offs are, first, studied using small signal modelling. It is explained why a 50% derating must be applied to high-speed transistors. Experimental measurements validate the analytical predictions. The influence of the distance between a switching cell and its decoupling capacitors is then studied; it appears that using a low-inductance – though simple – layout results in a stray inductance as low as 11 nH when the capacitor is 30 cm away from the switching cell, enabling degrees of freedom for thermal management.","PeriodicalId":150849,"journal":{"name":"2019 IEEE International Workshop on Integrated Power Packaging (IWIPP)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Study of the Impedance of the Bypassing Network of a Switching Cell – Influence of the Positioning of the Decoupling Capacitors\",\"authors\":\"Y. Pascal, D. Labrousse, M. Petit, F. Costa\",\"doi\":\"10.1109/IWIPP.2019.8799093\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mechanisms responsible for ringing and oscillations in power converters at transistors turn-offs are, first, studied using small signal modelling. It is explained why a 50% derating must be applied to high-speed transistors. Experimental measurements validate the analytical predictions. The influence of the distance between a switching cell and its decoupling capacitors is then studied; it appears that using a low-inductance – though simple – layout results in a stray inductance as low as 11 nH when the capacitor is 30 cm away from the switching cell, enabling degrees of freedom for thermal management.\",\"PeriodicalId\":150849,\"journal\":{\"name\":\"2019 IEEE International Workshop on Integrated Power Packaging (IWIPP)\",\"volume\":\"72 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Workshop on Integrated Power Packaging (IWIPP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWIPP.2019.8799093\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Workshop on Integrated Power Packaging (IWIPP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWIPP.2019.8799093","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of the Impedance of the Bypassing Network of a Switching Cell – Influence of the Positioning of the Decoupling Capacitors
Mechanisms responsible for ringing and oscillations in power converters at transistors turn-offs are, first, studied using small signal modelling. It is explained why a 50% derating must be applied to high-speed transistors. Experimental measurements validate the analytical predictions. The influence of the distance between a switching cell and its decoupling capacitors is then studied; it appears that using a low-inductance – though simple – layout results in a stray inductance as low as 11 nH when the capacitor is 30 cm away from the switching cell, enabling degrees of freedom for thermal management.