{"title":"一种新的光耦合器和led筛选方法","authors":"T. Takahashi, S. Todoroki, S. Mitani","doi":"10.1109/IRPS.1979.362888","DOIUrl":null,"url":null,"abstract":"In order to develop a non-destructive method to screen LEDs and couplers that degrade earlier under high temperature bias conditions, the relation between the degradation of emission efficiency and the initial reverse recovery time of LEDs has been investigated. The results show that those devices with shorter recovery time degrade faster.","PeriodicalId":161068,"journal":{"name":"17th International Reliability Physics Symposium","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A New Screening Method for Optocouplers and LEDS\",\"authors\":\"T. Takahashi, S. Todoroki, S. Mitani\",\"doi\":\"10.1109/IRPS.1979.362888\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to develop a non-destructive method to screen LEDs and couplers that degrade earlier under high temperature bias conditions, the relation between the degradation of emission efficiency and the initial reverse recovery time of LEDs has been investigated. The results show that those devices with shorter recovery time degrade faster.\",\"PeriodicalId\":161068,\"journal\":{\"name\":\"17th International Reliability Physics Symposium\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"17th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1979.362888\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"17th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1979.362888","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In order to develop a non-destructive method to screen LEDs and couplers that degrade earlier under high temperature bias conditions, the relation between the degradation of emission efficiency and the initial reverse recovery time of LEDs has been investigated. The results show that those devices with shorter recovery time degrade faster.
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