P. Pant, Joshua Zelman, G. Colón-Bonet, Jennifer Flint, Steve Yurash
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Lessons from at-speed scan deployment on an Intel® Itanium® microprocessor
Lessons learnt during the deployment of transition scan content on an Intel® Itanium® server microprocessor design and its use for electrical debug and defect screening in high-volume manufacturing are described. While many publications in the area of transition scan show it being practiced as an efficient defect screening tool, only a minority of these designs were high-performance microprocessor designs. This work illustrates the benefits of such techniques on complex microprocessors.
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