{"title":"数字网络处理器电源负载线效应的研究","authors":"T. Zhou, J. Golab","doi":"10.1109/EPEPS.2016.7835436","DOIUrl":null,"url":null,"abstract":"Digital networking processor power supplies typically have voltage sense points at die level so that the die level voltages are regulated and kept at constant DC levels. In this paper, we studied the load-line effect on the power supplies by simulations and lab measurements. We found that the total dissipated power for digital networking processors can be reduced by the introduction of the load-line effect in the regulation loop. The thermal design point of the system could be relaxed by introducing load-line operation without compromising the performance of these processors.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A study of load-line effect on power supplies of digital networking processors\",\"authors\":\"T. Zhou, J. Golab\",\"doi\":\"10.1109/EPEPS.2016.7835436\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Digital networking processor power supplies typically have voltage sense points at die level so that the die level voltages are regulated and kept at constant DC levels. In this paper, we studied the load-line effect on the power supplies by simulations and lab measurements. We found that the total dissipated power for digital networking processors can be reduced by the introduction of the load-line effect in the regulation loop. The thermal design point of the system could be relaxed by introducing load-line operation without compromising the performance of these processors.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835436\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835436","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A study of load-line effect on power supplies of digital networking processors
Digital networking processor power supplies typically have voltage sense points at die level so that the die level voltages are regulated and kept at constant DC levels. In this paper, we studied the load-line effect on the power supplies by simulations and lab measurements. We found that the total dissipated power for digital networking processors can be reduced by the introduction of the load-line effect in the regulation loop. The thermal design point of the system could be relaxed by introducing load-line operation without compromising the performance of these processors.