一种工业上兼容的超导单晶硅薄膜制造工艺

P. Dumas, M. Opprecht, S. Kerdilès, F. Lefloch, F. Nemouchi
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引用次数: 0

摘要

我们报告了一种工业上兼容的超导单晶硅薄膜(~ 30nm厚)的制造工艺。仅增加一个keV的硼植入能量就可以实现单晶薄膜的超导性,并使临界温度升高到390 mK。时间分辨反射法似乎是一种足够的在线表征方法,可以确定最有希望的工艺条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An industrially compatible process for the fabrication of superconducting monocrystalline Si films
We report an industrially compatible process for the fabrication of superconducting monocrystalline Si films (~ 30 nm thick). Increasing the boron implant energy by only one keV enables superconductivity in monocrystalline films and makes the critical temperature increase up to 390 mK. Time-Resolved-Reflectometry appears as an adequate in-line characterization to identify the most promising process conditions.
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